Popularity Prediction for Social Media over Arbitrary Time Horizons
Daniel Haimovich, Dima Karamshuk, Thomas Leeper, Evgeniy Riabenko, Milan Vojnovic
Total Ionizing Dose Assessment of a Commercial 200V PMOSFET
IEEE Nuclear & Space Radiation Effects Conference (NSREC)
Abstract
Total ionizing dose testing of commercial 200 V PMOSFETs. At 100 kRad(Si), observed VT increase of ~ 3 V for biased ON devices and increase of ~ 1 V for biased OFF devices. The RDS_ON did not degrade with dose.
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